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Le Champ unveils LeProfilometer
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Date: 
Wednesday, September 30, 2009

SINGAPORE - Le Champ unveils the LeProfilometer - a compact and versatile 3D non contact profilometer.

 

Non destructive profilometry

Compact and versatile 3D non contact profilometer

The LeProfilometer offers non-contact profilometry at low illumination levels. Nanometer axial and sub-micron lateral resolutions can be easily obtained at high speed.

 

This machine is designed to be suitable for bench top use in standalone laboratory environments or as an integrated component in an automated manufacturing system.

 

LeProfilometer offers high precision nanometer profiling using vertical scanning interferometry. It has a vertical scan range of 100μm with lateral resolution of 2.7μm and vertical resolution of 2nm. The LeProfilometer, which fits into an A4 format with its small footprint, can be transport conveniently.
 

About Le Champ

Le Champ (S.E.A.) Pte Ltd was established in 1982 in Singapore. We are in the business of supplying high-quality equipment and components for the electronics and semiconductor industries.

Our vision is driven by our philospohy of challenging ourselves to attain infiinite heights under honest and dutiful terms. Keep in step with technology through embracing innovation and creativity. Contribute back to society.