Hioki in-circuit HiTester 1240 is an X-Y type tester. It is a high-speed, high-precision, high-reliability populated board flying probe tester that is ideal for high-mix low volume production. Four-Wire measurement function enables detection of lifted leads of ICs as well as catching the dry joints. The capabilities extend to the active in-circuit test of FETs, relays, and 3-terminal voltage regulators--applications so far regarded as challenging test issues for conventional equipment. Optional features even allows to conduct simple functional measurement, boundary scan, and crystal oscillator frequency counting, etc.
HiTester 1224 is ideal for qualifying IC lead solder welding condition and dry joint detection.
Models
- 1240-01: High-speed testing of large boards (0.025 seconds/step)
- 1240-02: Ideal for testing for poor IC lead contact (1114 successor model)
- 1240-03: High-speed testing of mid-size boards (0.025 seconds/step)
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Features
- Detection of IC lifted-legs and dry joints
- High-speed testing at 0.025 seconds/step (1240-01/03 with 2.5 mm movements)
- Data protected at different security levels
- Test Data fully compatible with earlier models in the series
- Selectable optimized probing paths calculated after component heights of a given board is taken into account.
- Large size Board: Test Area up to 510 × 460 mm (1240-01/02)
- Mid size Board: Test Area up to 400 × 330 mm (1240-03)
- Optional Active Test feature allow functional testing of FETs, Relay operation, and 3-terminal Voltage Regulators.
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