Hioki Flying Probe Type X-Y Board HiTester 1270/1271

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Hioki Flying Probe Type X-Y Board HiTester 1270/1271

Hioki flying probe type tester 1270 is a double-sided board tester capable of pattern testing using the capacitance testing method as well as IVH low-resistance testing.

The 1270 is designed for maximum cost performance

 

 

 

 

Models
  • 1270 test area: 394 (W) × 324 (D) mm
  • 1271 test area: 604 (W) × 504 (D) mm
Features
  • High-precision probing (accommodates a minimum pad diameter of 20 μm)
  • High-speed testing (0.012 seconds/step)
  • Continuity and isolation testing (variable in 1 V steps from 1 to 250 V)
  • IVH and through hole low-resistance testing support (4-terminal measurement)
  • 4-terminal resistance testing (resolution: 0.2 μΩ)
  • L/C/R measurement function
  • Capacitance testing support (resolution of 5 aF = 5 × 10-18F)
  • Minimal probe marks
  • Large test area of 500 × 600 mm
  • Minimal probe impact marks
  • Simple operation

 
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