Le Champ Le Profilometer
Bookmark and Share
Le Champ Le Profilometer

The Le Profilometer offers non-contact profilometry at low illumination levels. Nanometer axial and sub-micron lateral resolutions can be easily obtained at high speed.

This machine is designed to be suitable for bench top use in standalone laboratory environments or as an integrated component in an automated manufacturing system.

LeProfilometer offers high precision nanometer profiling using vertical scanning interferometry. It has a vertical scan range of 100μm with lateral resolution of 2.7μm and vertical resolution of 2nm.

The LeProfilometer, which fits into an A4 format with its small footprint, can be transported conveniently.

Applications
  • Precision Engineering
  • Biotechnology
  • Semiconductors
  • Optics
Features
  • Non destructive profilometry
  • Robust and high reliability
  • Non-contact 3D surface metrology
  • Versatile
  • Simple Operation
  • Nanometer axial resolution
  • High speed
  • Compact, small footprint
Brochure Download
Note: You need to login in order to download the brochure. You may login or register as user here

 
Previous Page More Machine Products